Deposition of ZnO thin films from aqueous solution in a low power plasma reactor

被引:8
|
作者
Ma, Alexandre [1 ,2 ,3 ]
Rousseau, Frederic [1 ]
Donsanti, Frederique [2 ]
Lincot, Daniel [2 ]
Morvan, Daniel [1 ]
机构
[1] Chim ParisTech, Inst Rech Chim Paris, Equipe 2PM, Proc,Plasmas,Microsyst,UMR 8247,CNRS, F-75005 Paris, France
[2] Chim ParisTech, IRDEP, UMR7174, EDF,CNRS, F-78401 Chatou, France
[3] ADEME French Environm & Energy Management Agcy, F-49004 Angers 01, France
来源
关键词
Low power plasma process; Growth rate; Thin film; CIGS solar cell; ZnO; TRANSPARENT CONDUCTIVE AL; PULSED-LASER DEPOSITION; SOLAR-CELLS; ZINC-OXIDE; TEMPERATURE; LAYER; THICKNESS; COATINGS; MOCVD; GAP;
D O I
10.1016/j.surfcoat.2015.06.062
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The deposition of zinc oxide (ZnO) as a window layer in CuInGa(S,Se)2 (CIGS) thin film solar cells was studied in a low power plasma reactor. This deposition technique was used to obtain intrinsic ZnO thin layers from zinc nitrate Zn(NO3)(2) precursors dissolved in water. The liquid solution was injected under a spray form into oxidant plasma at low power (135 W) to be transformed into a ZnO coating deposited onto a substrate. The deposited ZnO films were analyzed to determine the electrical, optical and structural properties (SEM, XRD, FTIR, UV-vis, 4-point probes method). Analysis showed that the thin films were adherent, transparent, homogenous and crystallized under a Wurtzite form. This was in accordance with the required properties for a window layer in CIGS solar cells. In addition, the growth rate of ZnO was determined from micrographs to be equal to 0.61 nm s(-1) in the plasma reactor. This value was compared with the growth rate of usual ZnO deposition techniques and was found to be the highest This proved that this plasma reactor working at low power is very promising for the deposition of thin films for industrial CIGS application. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:186 / 194
页数:9
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