Structural and optical properties of DC Sputtered Cd2SnO4 nanocrystalline films

被引：35

作者：

El-Nahass, M. M. ^{[1
]}

Atta, A. A. ^{[1
,2
]}

Abd El-Raheem, M. M. ^{[2
,3
]}

Hassanien, A. M. ^{[4
]}

机构：

[1] Ain Shams Univ, Fac Educ, Dept Phys, Cairo 11757, Egypt

[2] Taif Univ, Fac Sci, Dept Phys, At Taif 888, Saudi Arabia

[3] Sohag Univ, Fac Sci, Dept Phys, Sohag 82524, Egypt

[4] Shaqra Univ, Fac Sci & Humanity Studies Al Quwayiyah, Dept Phys, Al Quwayiyah 11971, Saudi Arabia

来源：

JOURNAL OF ALLOYS AND COMPOUNDS | 2014年 / 585卷

关键词：

Cd2SnO4; DC Sputtered; Optical properties; CADMIUM-TIN-OXIDE; THIN-FILMS; ELECTRICAL-PROPERTIES; ABSORPTION EDGE; CONSTANTS; BEHAVIOR;

D O I：

10.1016/j.jallcom.2013.09.079

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

The structural and optical properties of DC Sputtered Cd2SnO4 thin Films have been reported. The structure of the films was analyzed by X-ray diffraction and atomic force microscopy (AFM). The optical constants (refractive index, n, and absorption index, k) of the as-deposited films have been obtained in the wavelength range 300-1800 nm by using spectrophotometric measurements at nearly normal incidence. The obtained absorption index, k, was used to estimate the type of optical transition for the as-deposited films. The single oscillator model and Drude model of free carriers' absorption have been used for the analysis of refractive index dispersion, in the normal dispersion range. (C) 2013 Elsevier B.V. All rights reserved.

引用

页码：1 / 6

页数：6

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