Influence analysis for linear measurement error models

被引:26
|
作者
Zhong, XP
Wei, BC
Fung, WK
机构
[1] Southeast Univ, Dept Math, Nanjing 210096, Peoples R China
[2] Univ Hong Kong, Dept Stat, Hong Kong, Hong Kong, Peoples R China
关键词
corrected likelihood; diagnostics; global influence; local influence; measurement error models;
D O I
10.1023/A:1004126108349
中图分类号
O21 [概率论与数理统计]; C8 [统计学];
学科分类号
020208 ; 070103 ; 0714 ;
摘要
In this paper, we present a unified diagnostic method for linear measurement error models based upon the corrected likelihood of Nakamura (1990, Biometrika, 77, 127-137). Both global influence and local influence are discussed. The case-deletion model and mean-shift outlier model are considered, and they are shown to be approximately equivalent. Several diagnostic measures are derived and discussed. It is found that they can be written in terms of the residual and leverage measure. Some existing results are improved. Numerical example illustrates that our method is useful for diagnosing influential observations.
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页码:367 / 379
页数:13
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