Stochastic model for phase noise measurement from 1-bit signal acquisition

被引：0
|
作者：
David-Grignot, Stephane [1 ,2 ]
Azais, Florence [1 ]
Latorre, Laurent [1 ]
Lefevre, Francois [2 ]
机构：
[1] Univ Montpellier 2, CNRS, LIRMM, F-34392 Montpellier, France
[2] NXP Semicond Caen, F-14000 Caen, France
来源：
2014 19TH INTERNATIONAL MIXED-SIGNALS, SENSORS AND SYSTEMS TEST WORKSHOP (IMS3TW) | 2014年
关键词：
Phase noise; analog signals; one bit acquisition; digital signal processing; ATE; stochastic model;
D O I：
暂无
中图分类号：
TP301 [理论、方法];
学科分类号：
081202 ;
摘要：
This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.
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页数：6
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