Phase Noise in Time Domain ADC Testing

被引：0
|
作者：
Slepicka, David [1 ]
机构：
[1] Czech Tech Univ, Fac Elect Engn, Prague 16627 6, Czech Republic
来源：
2008 IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-5 | 2008年
关键词：
ADC testing; phase noise; time domain; sine wave fitting;
D O I：
10.1109/IMTC.2008.4547103
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
The results of ADC dynamic testing are strongly dependent on test signal purity. From this reason, the spectral purity of the most common ADC test signal, sine wave, is often improved mostly by analog filters. Such analog signal processing can essentially suppress harmonic and spurious components but not phase noise. The effects of phase noise are therefore discussed in this paper and a possible way of low-frequency phase noise suppression in the time domain is proposed and an example shown.
引用
收藏
页码：579 / 582
页数：4
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