Effect of the geometry on the aging of Metalized Polypropylene Film capacitors

被引：0
|
作者：
El-Husseini, MH [1 ]
Venet, P [1 ]
Rojat, G [1 ]
Fathallah, M [1 ]
机构：
[1] CNRS, UMR 5005, UCBL, CEGELY, F-69621 Villeurbanne, France
来源：
PESC 2001: 32ND ANNUAL POWER ELECTRONICS SPECIALISTS CONFERENCE, VOLS 1-4, CONFERENCE PROCEEDINGS | 2001年
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D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Aging of MPPF capacitors have been studied in this paper with the aim to improve their reliability regarding their design. The statistical approach showed that the failure mode may be represented by two parameter Weibull distribution and the experimental approach proved that long capacitor deteriorates faster than a plate-shaped having the same features.
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页码：2061 / 2066
页数：6
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