A Perspective on Collaborative Research for Emerging Technologies and Design

被引:0
|
作者
Neureuther, Andrew R. [1 ]
机构
[1] Univ Calif Berkeley, Dept EECS, Berkeley, CA 94720 USA
关键词
semiconductor manufacturing; university-industry collaboration; modeling; computation; Design-for-Manufacturing; variability modeling;
D O I
10.1117/12.970297
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A perspective is given using student projects on how university research can be an important resource for the highly advanced and sophisticated photomask industry. The collaborative and cross-discipline nature of innovation in the IC industry naturally leads to win-win relationships. Specific examples are given of successful collaborative research projects from the University of California consortium "Integrated Modeling Process and Computation for Technology" ( IMPACT). The examples include research on lithography and inspection, devices, statistical characterization, and Design-for-Manufacturing frameworks for multiple-patterning and EUV. The paper concludes with a perspective on future opportunities, challenges and plans. The technical details of the student projects were published but not presented in connection with Photomask Japan 2011 (SPIE Proc. 8081).
引用
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页数:4
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