INTERFERENCE IN FAR-FIELD RADIATION OF EVANESCENT FIELDS

被引：2
|
作者：
Cortes, R. [1 ]
Coello, V. [1 ]
Segovia, P. [2 ]
Garcia, C. [2 ]
Merlo, J. M. [3 ]
Aguilar, J. F. [4 ]
机构：
[1] CICESE, Ctr Invest Cient & Educ Super Ensenada, Unidad Monterrey, Apodaca 66600, NL, Mexico
[2] UANL, Fac Ciencias Fis Matemat, San Nicolas De Los Garza 66451, NL, Mexico
[3] Tecnol Monterrey, Puebla 72800, Mexico
[4] Inst Nacl Astrofis Opt & Electr, Puebla 72800, Mexico
来源：
SURFACE REVIEW AND LETTERS | 2011年 / 18卷 / 06期
关键词：
Evanescent waves; optical interference; optical microscopy; WAVES; PRINCIPLE;
D O I：
10.1142/S0218625X11014746
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
We investigate experimentally the interference in far-field radiation of two contra-propagating evanescent fields using a conventional optical microscope. A laser beam illuminates a glass-air interface under total internal reflection condition and through the proper setup a double evanescent illumination was produced. The evanescent fields radiate from the surface into the far-field domain due to small surface scatterers. Thus, coherent interference is produced in the far-field region which is correlated with the relative positions of the evanescent illumination sources. Finally, the above-described could be considered as a device for high accuracy micro-scale measurements as well as a direct visualization method of evanescent phenomena.
引用
收藏
页码：261 / 265
页数：5
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