First-principles based ballistic transport simulation of monolayer and few-layer InSe FETs

被引:6
|
作者
Chang, Pengying [1 ]
Liu, Xiaoyan [1 ]
Liu, Fei [1 ,2 ]
Du, Gang [1 ]
机构
[1] Peking Univ, Inst Microelect, Key Lab Microelect Devices & Circuits, MOE, Beijing 100871, Peoples R China
[2] Univ Hong Kong, Ctr Theoret & Computat Phys, Dept Phys, Hong Kong, Peoples R China
基金
中国博士后科学基金; 中国国家自然科学基金;
关键词
ELECTRON-MOBILITY; HIGH-PERFORMANCE; TRANSISTORS; SCATTERING; DEVICE;
D O I
10.7567/1347-4065/aafb4f
中图分类号
O59 [应用物理学];
学科分类号
摘要
Ballistic performance of monolayer and few-layer indium selenide (InSe) based field effect transistors (FETs) is evaluated based on first principles calculation using density functional theory (DFT) and top-of-the-barrier transport model. Quantum confinement in atomically layered InSe is taken into account by self-consistently solving the Poisson and Schrodinger equations based on effective mass approximation. DFT calculations suggest that the electronic band structure of layered InSe strongly depend on the layer number, where the bandgap energy as well as electron effective mass gradually increases with layer number decreasing. Ballistic transport property as a function of layer number in InSe FET is calculated based on the thickness-dependent effective mass, and analyzed by the inversion density, injection velocity and quantum capacitance separately. Simulation results reveal that the InSe FETs with reduced layer number provide better electronic performance, showing great potential for future high-performance complementary metal-oxide-semiconductor application. (C) 2019 The Japan Society of Applied Physics
引用
收藏
页数:6
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