Accurate 3-D Capacitance of Parallel Plates from 2-D Analytical Superposition

被引:4
|
作者
Matick, Richard E. [1 ]
Ruehli, Albert E. [1 ,2 ]
机构
[1] IBM Res Ctr, Yorktown Hts, NY 10598 USA
[2] Missouri Univ Sci & Technol, Dept Electromagnet Interference, Rolla, MO 65409 USA
关键词
2-D superposition; 3-D capacitance from elliptic integrals; accurate 3-D strip line capacitance; universal capacitance curve; INTERCONNECT CAPACITANCES; VLSI CIRCUITS; FORMULAS;
D O I
10.1109/TCPMT.2012.2223817
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The two conductor strip line is a classic transmission line structure which has been extensively studied and used in endless applications for decades. Unfortunately, the exact determination of the 3-D capacitance of this basic case is analytically intractable. It will be shown that accurate values of the total 3-D capacitance of a parallel plate capacitor with thin plates of any length, width, and separation can be determined from the superposition of the exact 2-D capacitance obtained from an analytic solution using elliptic integrals in a very simple manner. The accuracy is determined for a range of cases through a comparison of the analytic values with those obtained from a 3-D numerical calculation, using a work station with very large memory and processing capability. For most cases, the accuracy of the capacitance obtained by this superposition method falls nearly within the bounds of the numerical accuracy of the 3-D model and the elliptical integral evaluations. This superposition method is far more accurate than expected.
引用
收藏
页码:299 / 305
页数:7
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