Sampling error analysis applied to high-accuracy measurements

被引：1
|
作者：
Barros e Vasconcellos, R. T.
Campos, M. L. R.
机构：
来源：
2008 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS DIGEST | 2008年
关键词：
D O I：
10.1109/CPEM.2008.4574795
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In this paper we apply a mathematical analysis of the main error sources in sampling theory to estimate alias and integration errors in asynchronous digital sampling measurements.
引用
收藏
页码：346 / 347
页数：2
相关论文
共 50 条
  • [1] Error analysis in high-accuracy digital measurements
    Barros e Vasconcellos, Renata T.
    de Campos, Marcello L. R.
    [J]. MEASUREMENT, 2012, 45 (05) : 881 - 888
  • [2] Sampling Systems With Fractional Delay and PCA Applied to High-Accuracy Measurements
    de Barros e Vasconcellos, Renata T.
    Rodrigues de Campos, Marcello L.
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2013, 62 (06) : 1407 - 1412
  • [3] HIGH-ACCURACY SAMPLING WATTMETER
    STENBAKKEN, GN
    DOLEV, A
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (06) : 974 - 978
  • [4] HIGH-ACCURACY MEASUREMENTS ON RAILGUNS
    WEY, J
    ECKENFELS, D
    GAUTHIER, C
    CHARON, R
    [J]. IEEE TRANSACTIONS ON MAGNETICS, 1995, 31 (01) : 764 - 769
  • [5] High-accuracy DFT analysis based on synchronous sampling techniques
    [J]. 2000, University of Electronic Science and Technology of China, China (29):
  • [6] Error analysis and correction of high-accuracy modulation domain measurement
    杜念文
    朱伟
    毛黎明
    [J]. Journal of Measurement Science and Instrumentation, 2013, 4 (02) : 142 - 145
  • [7] HIGH-ACCURACY SETTLING TIME MEASUREMENTS
    SCHOENWETTER, HK
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1983, 32 (01) : 22 - 27
  • [8] High-accuracy measurements on biperiodical circuits
    D'Elia, Alessandro
    Masullo, Maria Rosaria
    Vaccaro, Vittorio Giorgio
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2015, 26 (09)
  • [9] High-accuracy roundness measurements at NRC
    Aldous, C.
    Leroux, I. D.
    Eves, B. J.
    [J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 2018, 29 (12)
  • [10] HIGH-ACCURACY FOURIER-ANALYSIS BASED ON SYNCHRONOUS SAMPLING TECHNIQUES
    FERRERO, A
    OTTOBONI, R
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1992, 41 (06) : 780 - 785
12345