Evaluation of Students' Achievement in the Final Exam Questions for Microelectronic (KKKL3054) using the Rasch Model

被引:4
|
作者
Abdullah, Huda [1 ,2 ]
Arsad, Norhana [1 ,2 ]
Hashim, Fazida Hanim [2 ]
Aziz, Norazreen Abdul [2 ]
Amin, Nowshad [2 ]
Ali, Sawal Hamid [2 ]
机构
[1] Univ Kebangsaan Malaysia, Fac Engn & Built Environm, Ctr Engn Educ Res, Bangi, Malaysia
[2] Univ Kebangsaan Malaysia, Fac Engn & Built Environm, Dept Elect Elect & Syst Engn, Bangi, Malaysia
关键词
Microelectronic students (KKKL3054); student's achievement; Rasch Model; question from different difficulty level;
D O I
10.1016/j.sbspro.2012.09.356
中图分类号
G40 [教育学];
学科分类号
040101 ; 120403 ;
摘要
The assessment of the students in KKKL3054 Microelectronic includes PBL (20%), quizzes (10%), midterm exam (20%), tutorial (10%), and final exam (40%). In this paper, we discuss the performance of the students' achievement in the final examination. By using the Rasch model, the students' performance based on the difficulty level of each question, can be assessed. Each question is mapped to the number of students who are able to answer the question correctly. Results from the 17 students assessed, answering 15 questions of the final examination, showed that the distribution of the ability of each student answering questions from different levels of difficulty are fairly distributed. Findings from this evaluation can help us improve the course content as well as the course outcomes. We can conclude that by using the Rasch model, the ability of each student answering the final exam questions can be evaluated. (C) 2011 Published by Elsevier Ltd. Selection and/or peer reviewed under responsibility of the UKM Teaching and Learning Congress 2011
引用
收藏
页码:119 / 123
页数:5
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