Low-cost electroluminescence imaging for automated defect characterization in photovoltaic modules

被引：0

作者：

Bazzoli, Michael ^{[1
,2
]}

Silverman, Timothy J. ^{[2
]}

Goddard, Lynford L. ^{[1
]}

机构：

[1] Univ Illinois, Dept Elect & Comp Engn, Micro & Nanotechnol Lab, Photon Syst Lab, Urbana, IL 61801 USA

[2] Natl Renewable Energy Lab, Golden, CO 80401 USA

来源：

30TH ANNUAL CONFERENCE OF THE IEEE PHOTONICS SOCIETY (IPC) | 2017年

关键词：

Electroluminescence imaging; Photovoltaic module; defect characterization;

D O I：

暂无

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Electroluminescence (EL) i maging i s a fas t, well established, laboratory c haracterization to chnique for photovoltaic (PV) mod ules th at ty pically requires e xpensive equipment. H ere, we p resent a n ovel low-cost extensible EL imaging technique th at utilizes a modified camera and auxiliary hardware to automate EL imaging of field-deployed PV modules.

引用

页码：481 / 482

页数：2

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