A four-point surface conductivity probe suitable for in situ ultrahigh vacuum conductivity measurements

被引：21

作者：

Wiegenstein, CG ^{[1
]}

Schulz, KH ^{[1
]}

机构：

[1] MICHIGAN TECHNOL UNIV,DEPT CHEM ENGN,HOUGHTON,MI 49931

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1997年 / 68卷 / 04期

关键词：

D O I：

10.1063/1.1147968

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

A simple design for a four-point probe suitable for precision surface conductivity measurements is described. Our design makes use of small, commercially available spring contact probes which are mounted in a custom built MACOR ceramic probe head. The design is suitable for use in ultrahigh vacuum applications, and the custom-built parts can be fabricated in any machine shop, Very reproducible values were obtained using this probe for surface conductivity measurements on a MoS2(0001) model catalyst, a sputter deposited indium-tin oxide thin film and a doped silicon wafer. (C) 1997 American Institute of Physics.

引用

页码：1812 / 1813

页数：2

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