Kinetics of persistent photoconductivity in InGaN epitaxial films grown by MOCVD

被引:10
|
作者
Hung, H.
Chen, C. H.
Chang, S. J. [1 ]
Kuan, H.
Lin, R. M.
Liu, C. H.
机构
[1] Natl Cheng Kung Univ, Inst Microelect, Tainan 701, Taiwan
[2] Natl Cheng Kung Univ, Dept Elect Engn, Tainan 701, Taiwan
[3] Cheng Shiu Univ, Dept Elect Engn, Kaohsiung 830, Taiwan
[4] Far E Coll, Dept Elect Engn, Tainan 744, Taiwan
[5] Chang Gung Univ, Dept Elect Engn, Tao Yuan 333, Taiwan
[6] Nan Jeon Inst Technol, Dept Elect Engn, Yenshui 737, Taiwan
关键词
metal-organic chemical vapor deposition; semiconducting III-V materials;
D O I
10.1016/j.jcrysgro.2006.10.079
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
In this study, the spectral and temperature dependence of persistent photoconductivity (PPC) in InGaN, which was grown by metal-organic chemical vapor deposition (MOCVD), were discussed. The related optical and electrical properties of the InGaN epilayers have been investigated by PPC and photoluminescence (PL). The metastability was observed in InGaN epilayers with indium contents of 0.12 and 0.2, and show that the PPC effect arises from alloy potential fluctuations in InGaN layer. PPC decay behavior can be well described by a stretched-exponential function and the relaxation time constant tau and decay exponent beta both increase with increasing In content. Moreover, the carrier capture energy barrier for free carrier capture by defects Delta E was found to increase with the increase of indium concentration as well. All these observations show clearly a relation between localized exciton in InGaN-based optoelectronic devices, and the deep levels significantly influence the carrier lifetime of minority carrier devices. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:246 / 250
页数:5
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