Efficiency of ADC linearity estimators

被引：0

作者：

Carbone, P ^{[1
]}

Nunzi, E ^{[1
]}

Petri, D ^{[1
]}

机构：

[1] Univ Perugia, DIEI, I-06125 Perugia, Italy

来源：

IMTC/2001: PROCEEDINGS OF THE 18TH IEEE INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE, VOLS 1-3: REDISCOVERING MEASUREMENT IN THE AGE OF INFORMATICS | 2001年

关键词：

Cramer-Rao bound; sinewave histogram test; statistical efficiency;

D O I：

暂无

中图分类号：

TP18 [人工智能理论];

学科分类号：

081104 ; 0812 ; 0835 ; 1405 ;

摘要：

The paper presents an analysis of the statistical efficiency of the sinewave histogram test used for estimating the unknown transition levels of an analog-to-digital converter. Accordingly, at first a closed-form determination of the Cramer-Rao, bound is derived under the assumption of a noiseless stimulus signal. Both unbiased and biased versions of the bound are described in order to account for the eventual bias introduced by commonly employed estimators. Then, additive Gaussian noise is assumed and comments are made about its effects on the maximum achievable accuracy.

引用

页码：1858 / 1861

页数：2

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