A novel repair method for integrated gate driver circuit

被引：0
|
作者：
Yeh, Yen-Hsien [1 ]
Wei, Chun-Ching [1 ]
Lo, Shih-Hsun [1 ]
Wu, Yang-En [1 ]
机构：
[1] AU Optron Corp, Ctr Technol, Hsinchu 300, Taiwan
来源：
IDW '06: PROCEEDINGS OF THE 13TH INTERNATIONAL DISPLAY WORKSHOPS, VOLS 1-3 | 2006年
关键词：
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
We have designed a repair structure that can be used for repairing integrated gate driver circuit. This structure consists of several wires to connect the redundant circuit and the shift register for repairing. We have developed 12.1 inches WXGA a-Si TFT-LCD prototype panels with the repair structure, and there is no horizontal line defect occurred after panel repairing. The output of the repair structure is confirmed to be the same with normal gate driver by the experimental results.
引用
收藏
页码：761 / 763
页数：3
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