Atomic force microscopy of polymers and related compounds

Surface analysis with scanning tunneling (STM) and atomic force microscopy (AFM) became an important subject in materials science. These microscopic techniques allow to detect surface features from macroscopic (hundreds m) to atomic scale with unique sub-angstrom resolution. Characterization of polymer surfaces by AFM is the main topic of the review. First, practical and theoretical aspects of both scanning probe techniques are considered, and the important role of tip-sample interactions is clarified. Then, STM applications to polymer samples and model compounds are shortly described. The main part contains the analysis of AFM images obtained on polymer crystalline surfaces, oriented polymer samples, and surfaces of block copolymers.