Chaos in Solitary VCSELs: Exploring the Parameter Space With Advanced Sampling

被引:3
|
作者
Virte, Martin [1 ,2 ]
Ferranti, Francesco [3 ]
机构
[1] Vrije Univ Brussel, Brussels Photon, B-1050 Brussels, Belgium
[2] Res Fdn Flanders FWO, B-1000 Brussels, Belgium
[3] CNRS, UMR 6285, Lab STICC, Microwave Dept,Inst Tecom Atlantique, F-29238 Brest 3, France
关键词
Chaos; optical chaos; parameter space exploration; sampling schemes; semiconductor laser; VCSEL; SURFACE-EMITTING LASERS; SEMICONDUCTOR-LASERS; POLARIZATION PROPERTIES; BIREFRINGENCE;
D O I
10.1109/JLT.2017.2784847
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We explore the parameter space of the so-called spin-flip model by advanced sampling techniques to analyze the requirements leading to polarization chaos in solitary vertical-cavity surface-emitting lasers. We first investigate the performances of different sampling techniques for multidimensional parameter space exploration. Purely random sampling and tensor-product grids require a large amount of samples to uniformly cover the whole space, and we show that other schemes are highly superior to this regard, hence allowing a reduced number of samples and computation to be used to reach the same level of insight in the system behavior. Considering the scarcity of the chaotic regions and their sharp boundaries, combined with quite involved computations to identify chaotic dynamics, the proposed approach is shown to be highly beneficial. Here, we are able to highlight two thresholds limiting the range of injection current for which chaos can be observed, and to link them to a fine balance between the spin relaxation rate and the birefringence.
引用
收藏
页码:1601 / 1607
页数:7
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