Joint Effects of Synchronization Errors of OFDM Systems in Doubly-Selective Fading Channels

被引:8
|
作者
Chin, Wen-Long [1 ]
Chen, Sau-Gee [2 ,3 ]
机构
[1] Natl Cheng Kung Univ, Dept Engn Sci, Tainan 701, Taiwan
[2] Natl Chiao Tung Univ, Dept Elect Engn, Hsinchu 30050, Taiwan
[3] Natl Chiao Tung Univ, Inst Elect, Hsinchu 30050, Taiwan
关键词
D O I
10.1155/2008/840237
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The majority of existing analyses on synchronization errors consider only partial synchronization error factors. In contrast, this work simultaneously analyzes joint effects of major synchronization errors, including the symbol time offset (STO), carrier frequency offset (CFO), and sampling clock frequency offset (SCFO) of orthogonal frequency-division multiplexing (OFDM) systems in doubly-selective fading channels. Those errors are generally coexisting so that the combined error will seriously degrade the performance of an OFDM receiver by introducing intercarrier interference (ICI) and intersymbol interference (ISI). To assist the design of OFDM receivers, we formulate the theoretical signal-to-interference-and-noise ratio (SINR) due to the combined error effect. As such, by knowing the required SINR of a specific application, all combinations of allowable errors can be derived, and cost-effective algorithms can be easily characterized. By doing so, it is unnecessary to run the time-consuming Monte Carlo simulations, commonly adopted by many conventional designs of synchronization algorithms, in order to know those combined error effects. Copyright (C) 2008 W.- L. Chin and S.-G. Chen.
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页数:9
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