Electron diffraction analysis of individual single-walled carbon nanotubes

被引：60
|
作者：
Meyer, JC [1 ]
Paillet, M
Duesberg, GS
Roth, S
机构：
[1] Max Planck Inst Solid State Res, Stuttgart, Germany
[2] Univ Montpellier 2, Lab Colloides Verres & Nanomat, Montpellier, France
[3] Infineon Technol Corp Res, Munich, Germany
来源：
ULTRAMICROSCOPY | 2006年 / 106卷 / 03期
关键词：
carbon nanotubes; electron diffraction; nanotube and TEM sample preparation;
D O I：
10.1016/j.ultramic.2005.07.008
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
We present a detailed electron diffraction study of individual single-walled carbon nanotubes. A novel sample preparation procedure provides well-separated, long and straight individual single-shell nanotubes. Diffraction experiments are carried out at 60kV, below the threshold for knock-on damage in carbon nanotubes. We describe experimental parameters that allow single-tube electron diffraction experiments with widely available thermal emission transmission electron microscopes. Further, we review the simulation of diffraction patterns for these objects. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码：176 / 190
页数：15
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