Relation of n-value to critical current in bent-damaged Bi2223 composite tape

被引:0
|
作者
Ochiai, S. [1 ]
Okuda, H. [1 ]
Sugano, M. [2 ]
Hojo, M. [1 ]
Osamura, K. [3 ]
Kuroda, T. [4 ]
Kumakura, H. [4 ]
Kitaguchi, H. [4 ]
Itoh, K. [4 ]
Wada, H. [4 ]
机构
[1] Kyoto Univ, Grad Sch Engn, Sakyo Ku, Kyoto 6068501, Japan
[2] High Energy Accelerator Res Org, Cryogen Sci Ctr, J PARC Ctr, Tokai, Ibaraki 3191106, Japan
[3] Res Inst Appl Sci, Sakyo Ku, Kyoto 6068202, Japan
[4] Natl Inst Mat Sci, Tsukuba, Ibaraki 3050047, Japan
来源
关键词
Bi2223 composite tape; Critical current; n-value; Bending strain; Damage evolution; SUPERCONDUCTING TAPES;
D O I
10.1016/j.phpro.2012.03.461
中图分类号
O59 [应用物理学];
学科分类号
摘要
The relation of n-value to critical current of bent-damaged (Bi,Pb)(2)Sr2Ca2Cu3O10+delta (Bi2223) composite tape was studied experimentally and analytically. The experimental results showed that, under bending strain, the n-value decreased rather slightly with decreasing critical current in comparison with the data obtained under applied tensile strain. The experimentally observed slight decrease in n-value with critical current under bending strain, and the measured changes in critical current and n-value with increasing bending strain, were described satisfactorily by the presented damage evolution model that correlates the extent of damage to variation of bending strain-induced tensile strain in the core along the thickness direction. (C) 2012 Published by Elsevier B.V. Selection and/or peer-review under responsibility of ISS Program Committee.
引用
收藏
页码:264 / 267
页数:4
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