Advanced Microwave Imaging

被引：243
|
作者：
Ahmed, Sherif Sayed [1 ]
Schiessl, Andreas [1 ]
Gumbmann, Frank [1 ]
Tiebout, Marc [2 ]
Methfessel, Sebastian [3 ]
Schmidt, Lorenz-Peter [3 ]
机构：
[1] Rohde & Schwarz GmbH & Co KG, Munich, Germany
[2] Infineon Technol, Villach, Austria
[3] Univ Erlangen Nurnberg, Erlangen, Germany
来源：
IEEE MICROWAVE MAGAZINE | 2012年 / 13卷 / 06期
关键词：
WAVE; MIGRATION; DESIGN; ARRAY;
D O I：
10.1109/MMM.2012.2205772
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：26 / 43
页数：18
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