Metrological analysis of the LIDFT method

被引：27

作者：

Borkowski, J ^{[1
]}

Mroczka, J ^{[1
]}

机构：

[1] Wroclaw Tech Univ, Dept Elect, Wroclaw, Poland

来源：

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT | 2002年 / 51卷 / 01期

关键词：

DFT; frequency domain measurements; frequency estimation; interpolated FFT; LIDFT; linearizing data window; parametric estimation; spectrum estimation;

D O I：

10.1109/19.989903

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The estimation error components in the DFT linear interpolation (LENT) method have been presented in the paper. The equations for random errors, total error, the minimum and optimal parameter value of data window for the case of one complex oscillation, and also the metrological analysis of the multifrequency signal case are presented. This analysis allows estimating final method accuracy and obtaining the relation for the optimal data window parameter.

引用

页码：67 / 71

页数：5

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