Energy-Dispersive X-ray Spectrometry Performance on Multiple Transmission Electron Microscope Platforms

被引：0

作者：

Demarest, James ^{[1
]}

Deeb, Chris ^{[1
]}

Murray, Thomas ^{[1
]}

Zhai, Hong-Ying ^{[1
]}

机构：

[1] IBM Corp, Albany, NY USA

来源：

ISTFA 2010: CONFERENCE PROCEEDINGS FROM THE 36TH INTERNATIONAL SYMPOSIUM FOR TESTING AND FAILURE ANALYSIS | 2010年

关键词：

D O I：

暂无

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

引用

页码：301 / 303

页数：3

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