A P1500 compliant BIST-based approach to embedded RAM diagnosis

被引：10

作者：

Appello, D ^{[1
]}

Corno, F ^{[1
]}

Giovinetto, M ^{[1
]}

Rebaudengo, M ^{[1
]}

Reorda, MS ^{[1
]}

机构：

[1] Politecn Torino, Dipartimento Automat & Informat, I-10129 Turin, Italy

来源：

10TH ASIAN TEST SYMPOSIUM, PROCEEDINGS | 2001年

关键词：

D O I：

10.1109/ATS.2001.990266

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows to test multiple modules in the some chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements.

引用

页码：97 / 102

页数：6

共 40 条

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