Aggressiveness of self-etch adhesives on unground enamel

被引:0
|
作者
Tay, FR
Pashley, DH
King, NM
Carvalho, RM
Tsai, J
Lai, SCN
Marquezini, L
机构
[1] Univ Hong Kong, Fac Dent, Hong Kong, Hong Kong, Peoples R China
[2] Med Coll Georgia, Sch Dent, Dept Oral Biol & Maxillofacial Pathol, Augusta, GA 30912 USA
[3] Univ Hong Kong, Fac Dent, Hong Kong, Hong Kong, Peoples R China
[4] Univ Sao Paulo, Bauru Sch Dent, BR-05508 Sao Paulo, Brazil
关键词
D O I
暂无
中图分类号
R78 [口腔科学];
学科分类号
1003 ;
摘要
Manufacturers of mild self-etch adhesives advocate the adjunctive use of phosphoric acid etching when bonding to unground enamel. This study tested the null hypothesis that there is no difference between the recently introduced, more aggressive self-etch adhesives and a total-etch adhesive in bonding to unground enamel. The ultrastructure and microtensile bond strengths (muTBS) of Xeno III (Dentsply) and Simplicity (Apex Dental Materials), bonded to unground enamel, were examined after thermocycling. Clearfil SE Bond (Kuraray), a mild self-etch adhesive, was used as the negative control, and One-Step (BISCO), a total-etch adhesive bonded to phosphoric acid-etched unground enamel, was used as the positive control. Differences in the thickness of enamel hybrid layers were observed and the aggressiveness of apatite dissolution in the four adhesives.
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页码:309 / 316
页数:8
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