首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
Guest Editorial: Special Section on International Conference on Program Comprehension, 2011
被引:0
|
作者
:
Ricca, Filippo
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Genoa, DIBRIS, I-16146 Genoa, Italy
Univ Genoa, DIBRIS, I-16146 Genoa, Italy
Ricca, Filippo
[
1
]
Dean, Thomas R.
论文数:
0
引用数:
0
h-index:
0
机构:
Queens Univ, Dept Elect & Comp Engn, Kingston, ON K7L 3N6, Canada
Univ Genoa, DIBRIS, I-16146 Genoa, Italy
Dean, Thomas R.
[
2
]
Sim, Susan Elliott
论文数:
0
引用数:
0
h-index:
0
机构:
Many Rd Studios, Toronto, ON M4N 2S2, Canada
Univ Genoa, DIBRIS, I-16146 Genoa, Italy
Sim, Susan Elliott
[
3
]
机构
:
[1]
Univ Genoa, DIBRIS, I-16146 Genoa, Italy
[2]
Queens Univ, Dept Elect & Comp Engn, Kingston, ON K7L 3N6, Canada
[3]
Many Rd Studios, Toronto, ON M4N 2S2, Canada
来源
:
INFORMATION AND SOFTWARE TECHNOLOGY
|
2013年
/ 55卷
/ 04期
关键词
:
D O I
:
10.1016/j.infsof.2012.08.011
中图分类号
:
TP [自动化技术、计算机技术];
学科分类号
:
0812 ;
摘要
:
引用
收藏
页码:719 / 721
页数:3
相关论文
共 50 条
[1]
Guest Editorial: Special Section on the International Conference on Data Engineering
Jensen, Christian S.
论文数:
0
引用数:
0
h-index:
0
机构:
Aalborg Univ, Dept Comp Sci, DK-9220 Aalborg, Denmark
Aalborg Univ, Dept Comp Sci, DK-9220 Aalborg, Denmark
Jensen, Christian S.
Jermaine, Christopher
论文数:
0
引用数:
0
h-index:
0
机构:
Rice Univ, Dept Comp Sci, Houston, TX 77251 USA
Aalborg Univ, Dept Comp Sci, DK-9220 Aalborg, Denmark
Jermaine, Christopher
Zhou, Xiaofang
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Queensland, Sch Informat Technol & Elect Engn, Brisbane, Qld 4072, Australia
Aalborg Univ, Dept Comp Sci, DK-9220 Aalborg, Denmark
Zhou, Xiaofang
[J].
IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING,
2015,
27
(07)
: 1739
-
1740
[2]
Guest Editorial: Special Section on the International Conference on Data Engineering
Cruz, Isabel F.
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Illinois, Comp Sci, Chicago, IL 60607 USA
Univ Illinois, Comp Sci, Chicago, IL 60607 USA
Cruz, Isabel F.
论文数:
引用数:
h-index:
机构:
Ferrari, Elena
Tao, Yufei
论文数:
0
引用数:
0
h-index:
0
机构:
Chinese Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
Univ Illinois, Comp Sci, Chicago, IL 60607 USA
Tao, Yufei
[J].
IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING,
2016,
28
(02)
: 295
-
296
[3]
Guest Editorial: Special Section on the International Conference on Data Engineering
Gehrke, Johannes
论文数:
0
引用数:
0
h-index:
0
机构:
Cornell Univ, Dept Comp Sci, Ithaca, NY 14853 USA
Microsoft Corp, Redmond, WA 98052 USA
Cornell Univ, Dept Comp Sci, Ithaca, NY 14853 USA
Gehrke, Johannes
Ooi, Beng Chin
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Univ Singapore, Singapore 117548, Singapore
Cornell Univ, Dept Comp Sci, Ithaca, NY 14853 USA
Ooi, Beng Chin
Pitoura, Evaggelia
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Ioannina, Dept Comp Sci & Engn, GR-45110 Ioannina, Greece
Cornell Univ, Dept Comp Sci, Ithaca, NY 14853 USA
Pitoura, Evaggelia
[J].
IEEE TRANSACTIONS ON KNOWLEDGE AND DATA ENGINEERING,
2014,
26
(06)
: 1298
-
1299
[4]
Guest editor's introduction to the special section on the 2009 international conference on program comprehension (ICPC 2009)
Koschke, Rainer
论文数:
0
引用数:
0
h-index:
0
机构:
Univ Bremen, Bremen, Germany
Univ Bremen, Bremen, Germany
Koschke, Rainer
Marcus, Andrian
论文数:
0
引用数:
0
h-index:
0
机构:
Wayne State Univ, Detroit, MI USA
Univ Bremen, Bremen, Germany
Marcus, Andrian
Gannod, Gerald C.
论文数:
0
引用数:
0
h-index:
0
机构:
Miami Univ, Oxford, OH 45056 USA
Univ Bremen, Bremen, Germany
Gannod, Gerald C.
[J].
SOFTWARE QUALITY JOURNAL,
2011,
19
(01)
: 3
-
4
[5]
Guest editor’s introduction to the special section on the 2009 international conference on program comprehension (ICPC 2009)
Rainer Koschke
论文数:
0
引用数:
0
h-index:
0
机构:
University of Bremen,
Rainer Koschke
Andrian Marcus
论文数:
0
引用数:
0
h-index:
0
机构:
University of Bremen,
Andrian Marcus
Gerald C. Gannod
论文数:
0
引用数:
0
h-index:
0
机构:
University of Bremen,
Gerald C. Gannod
[J].
Software Quality Journal,
2011,
19
: 3
-
4
[6]
Guest editorial - Special section on the international conference on microelectronic test structures
Verzi, B
论文数:
0
引用数:
0
h-index:
0
机构:
Agilent Technol, Austin, TX 78759 USA
Agilent Technol, Austin, TX 78759 USA
Verzi, B
Walton, AJ
论文数:
0
引用数:
0
h-index:
0
机构:
Agilent Technol, Austin, TX 78759 USA
Walton, AJ
[J].
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING,
2004,
17
(02)
: 77
-
78
[7]
Guest Editorial Special Section on the 2012 International Conference on Microelectronic Test Structures
Weiland, Larg H.
论文数:
0
引用数:
0
h-index:
0
机构:
PDF Solut Inc, San Jose, CA USA
PDF Solut Inc, San Jose, CA USA
Weiland, Larg H.
[J].
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING,
2013,
26
(03)
: 261
-
261
[8]
Guest Editorial: Special Section on the IEEE TNANO International Nanoelectronics Conference (INEC)
Kok, C. -W.
论文数:
0
引用数:
0
h-index:
0
机构:
Canaan Semicond Ltd, Hong Kong, Hong Kong, Peoples R China
Canaan Semicond Ltd, Hong Kong, Hong Kong, Peoples R China
Kok, C. -W.
Tam, W. -S.
论文数:
0
引用数:
0
h-index:
0
机构:
Canaan Semicond Ltd, Hong Kong, Hong Kong, Peoples R China
Canaan Semicond Ltd, Hong Kong, Hong Kong, Peoples R China
Tam, W. -S.
Wong, H.
论文数:
0
引用数:
0
h-index:
0
机构:
City Univ Hong Kong, Hong Kong, Hong Kong, Peoples R China
Canaan Semicond Ltd, Hong Kong, Hong Kong, Peoples R China
Wong, H.
[J].
IEEE TRANSACTIONS ON NANOTECHNOLOGY,
2018,
17
(01)
: 3
-
3
[9]
Guest Editorial Special Section on the 2015 International Conference on Automation Science and Engineering
Fabian, Martin
论文数:
0
引用数:
0
h-index:
0
机构:
Chalmers, Gothenburg, Sweden
Chalmers, Gothenburg, Sweden
Fabian, Martin
Lennartson, Bengt
论文数:
0
引用数:
0
h-index:
0
机构:
Chalmers, Gothenburg, Sweden
Chalmers, Gothenburg, Sweden
Lennartson, Bengt
Akesson, Knut
论文数:
0
引用数:
0
h-index:
0
机构:
Chalmers, Gothenburg, Sweden
Chalmers, Gothenburg, Sweden
Akesson, Knut
[J].
IEEE TRANSACTIONS ON AUTOMATION SCIENCE AND ENGINEERING,
2017,
14
(02)
: 692
-
693
[10]
Guest editorial - Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics
Seiler, David G.
论文数:
0
引用数:
0
h-index:
0
机构:
Natl Inst Stand & Technol, Div Semicond Elect, Elect & Elect Engn Lab, Gaithersburg, MD 20899 USA
Natl Inst Stand & Technol, Div Semicond Elect, Elect & Elect Engn Lab, Gaithersburg, MD 20899 USA
Seiler, David G.
[J].
IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING,
2006,
19
(04)
: 370
-
371
←
1
2
3
4
5
→