Automatic Assessment of Student Answers Consisting of Venn and Euler Diagrams

被引：4
|
作者：
Wijesinghe, Diunuge B. [1 ]
Kadupitiya, Jcs [1 ]
Ranathunga, Surangika [1 ]
Dias, Gihan [1 ]
机构：
[1] Univ Moratuwa, Dept Comp Sci & Engn, Katubedda 10400, Sri Lanka
来源：
2017 IEEE 17TH INTERNATIONAL CONFERENCE ON ADVANCED LEARNING TECHNOLOGIES (ICALT) | 2017年
关键词：
Diagram Assessment; Venn Diagram; Euler Diagram; Set Theory; Diagram Rubric;
D O I：
10.1109/ICALT.2017.107
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
Venn and Euler diagrams are well-defined mathematical diagram types, which are the major representation methods of Set Theory. Venn and Euler diagrams are part of major Mathematics examinations in secondary education such as London Ordinary Level and SAT. Although computer assessment of different diagram types has been addressed, no such research has been done for Venn and Euler diagrams. In this research, we present a system capable of automatically assessing student answers consisting of Venn and Euler diagrams. The student answer is compared against a model answer, and marks are allocated according to a marking rubric.
引用
收藏
页码：243 / 247
页数：5
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