Thin-film thickness-modulated designs for optical minus filter

被引：29

作者：

Zhang, Jinlong ^{[1
,2
]}

Xie, Yujiang ^{[1
,2
]}

Cheng, Xinbin ^{[1
,2
]}

Jiao, Hongfei ^{[1
,2
]}

Wang, Zhanshan ^{[1
,2
]}

机构：

[1] Minist Educ, Key Lab Adv Microstruct Mat, Shanghai 200092, Peoples R China

[2] Tongji Univ, Dept Phys, Inst Precis Opt Engn, Shanghai 200092, Peoples R China

来源：

APPLIED OPTICS | 2013年 / 52卷 / 23期

基金：

中国国家自然科学基金;

关键词：

RUGATE FILTERS; SIDELOBE SUPPRESSION; COATINGS;

D O I：

10.1364/AO.52.005788

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We proposed an analytical method to design optical minus filters by the thickness modulation of discrete, homogeneous thin-film layers of a two-material multilayer coating. The main stack provides the narrow, second-order rejection band, and the correct thickness-modulation apodization and match layers can effectively suppress the sidelobes of the passband. Using this approach, we can design minus filters with layer thicknesses close to half-wave of the rejection wavelength, making this method well suited for accurate monitoring during the deposition. (C) 2013 Optical Society of America

引用

页码：5788 / 5793

页数：6

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