X-ray analysis of ZnO nanorods grown by microwave irradiation heating on ZnO films

被引：8
|
作者：
Ogata, K. [1 ]
Koike, K. [1 ]
Sasa, S. [1 ]
Inoue, M. [1 ]
Yano, M. [1 ]
机构：
[1] Osaka Inst Technol, Nanomat Microdevices Res Ctr, Osaka 5358585, Japan
来源：
APPLIED SURFACE SCIENCE | 2008年 / 254卷 / 23期
关键词：
ZnO nanorods; X-ray diffraction;
D O I：
10.1016/j.apsusc.2008.02.008
中图分类号：
O64 [物理化学（理论化学）、化学物理学];
学科分类号：
070304 ; 081704 ;
摘要：
Utilizing microwave irradiation heating, 100-nm-diameter ZnO nanorods were grown from aqueous solution on sputtered ZnO films on glass substrates. Its out-of-plane X-ray diffraction (XRD) measurement indicated that the ZnO nanorods were grown with c-axis orientation, similar with the underlying ZnO films. In the in-plane XRD measurement, intensity of the (11 (2) over bar0) diffraction was comparable with that of the ( 10 (1) over bar0) one, suggesting their intensity ratio would contain useful information on nanorods density. (C) 2008 Elsevier B.V. All rights reserved.
引用
收藏
页码：7708 / 7711
页数：4
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