Calculation of metamorphic two-dimensional quantum energy system: Application to wetting layer states in InAs/InGaAs metamorphic quantum dot nanostructures

被引:21
|
作者
Seravalli, L. [1 ]
Trevisi, G. [1 ]
Frigeri, P. [1 ]
机构
[1] IMEM CNR Inst, I-43100 Parma, Italy
关键词
MU-M; RESIDUAL STRAIN; GAAS SUBSTRATE; GROWTH; SEMICONDUCTORS; BUFFERS; LASERS;
D O I
10.1063/1.4830021
中图分类号
O59 [应用物理学];
学科分类号
摘要
In this work, we calculate the two-dimensional quantum energy system of the In(Ga)As wetting layer that arises in InAs/InGaAs/GaAs metamorphic quantum dot structures. Model calculations were carried on the basis of realistic material parameters taking in consideration their dependence on the strain relaxation of the metamorphic buffer; results of the calculations were validated against available literature data. Model results confirmed previous hypothesis on the extrinsic nature of the disappearance of wetting layer emission in metamorphic structures with high In composition. We also show how, by adjusting InGaAs metamorphic buffer parameters, it could be possible: (i) to spatially separate carriers confined in quantum dots from wetting layer carriers, (ii) to create an hybrid 0D-2D system, by tuning quantum dot and wetting layer levels. These results are interesting not only for the engineering of quantum dot structures but also for other applications of metamorphic structures, as the two design parameters of the metamorphic InGaAs buffer (thickness and composition) provide additional degrees of freedom to control properties of interest. (C) 2013 AIP Publishing LLC.
引用
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页数:8
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