Characterization of cross-plane thermoelectric properties of Si/Ge superlattices

被引：1
|
作者：
Bao, Y [1 ]
Liu, JL [1 ]
Wang, K [1 ]
Chen, G [1 ]
机构：
[1] Univ Calif Los Angeles, Dept Mech & Aerosp Engn, Los Angeles, CA 90095 USA
来源：
TWENTIETH INTERNATIONAL CONFERENCE ON THERMOELECTRICS, PROCEEDINGS | 2001年
关键词：
D O I：
10.1109/ICT.2001.979902
中图分类号：
O414.1 [热力学];
学科分类号：
摘要：
In this paper, a novel method is developed to measure simultaneously the Seebeck coefficient and thermal conductivity in the cross-plane direction of thin films. Using a differential measurement between a superlattice sample and a reference sample, the temperature and voltage drops cross the superlattice thin film are determined and used to deduce its cross plane thermal conductivity and Seebeck coefficient.
引用
收藏
页码：344 / 347
页数：4
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