Terahertz magneto-optical spectroscopy in HgTe thin films

被引：36

作者：

Shuvaev, A. M. ^{[1
]}

Astakhov, G. V. ^{[2
]}

Bruene, C. ^{[3
]}

Buhmann, H. ^{[3
]}

Molenkamp, L. W. ^{[3
]}

Pimenov, A. ^{[1
]}

机构：

[1] Vienna Univ Technol, Inst Solid State Phys, A-1040 Vienna, Austria

[2] Univ Wurzburg, Phys Inst EP6, D-97074 Wurzburg, Germany

[3] Univ Wurzburg, Phys Inst EP3, D-97074 Wurzburg, Germany

来源：

SEMICONDUCTOR SCIENCE AND TECHNOLOGY | 2012年 / 27卷 / 12期

关键词：

CYCLOTRON-RESONANCE;

D O I：

10.1088/0268-1242/27/12/124004

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Thin films of HgTe have been systematically investigated using continuous frequency terahertz spectroscopy in external magnetic fields. In these experiments, full control of the polarization state can be achieved including Faraday rotation and ellipticity. We present the details of the experimental procedure and of the data analysis. Besides the cyclotron resonance, an additional mode is observed in the zero-gap sample. The results at high temperatures can be well understood within the classical Drude model of the dynamic conductivity. Possible dimensionality of the charge dynamics at low temperatures is discussed.

引用

页数：7

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