Study of terahertz radiation from InAs and InSb

被引:300
|
作者
Gu, P
Tani, M
Kono, S
Sakai, K
Zhang, XC
机构
[1] Kansai Adv Res Ctr, Commun Res Lab, Kobe, Hyogo 6512492, Japan
[2] Rensselaer Polytech Inst, Dept Phys Appl Phys & Astron, Troy, NY 12180 USA
关键词
D O I
10.1063/1.1465507
中图分类号
O59 [应用物理学];
学科分类号
摘要
Terahertz radiation from InSb and InAS, which are typical narrow band-gap semiconductors, was investigated using time-resolved THz emission measurements. When we compared between the polarity of the THz waveforms of these narrow band-gap semiconductors with that of InP, which is a wide bandgap semiconductor, we concluded that the ultrafast buildup of the photo-Dember field is the main mechanism for the emission of THz radiation in both InAs and InSb. The emission efficiency of InSb is approximately one-hundredth of that of InAs, although the electron mobility in InSb is higher than in InAs. Wavelength-dependent measurements implied that the anomalously low THz emission efficiency of InSb might be due to a reduction in transient mobility resulting from the scattering of electrons into the low-mobility L valley. (C) 2002 American Institute of Physics.
引用
收藏
页码:5533 / 5537
页数:5
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