Analog Fault Diagnosis and Testing By Inverse Problem Technique

被引：0

作者：

Ahmed, R. F. ^{[1
]}

Radwan, A. G. ^{[2
]}

Madian, A. H. ^{[3
]}

Soliman, A. M. ^{[4
]}

机构：

[1] Fayoum Univ, Fac Engn, Dept Elect Engn, Faiyum, Egypt

[2] Cairo Univ, Fac Engn, Dept Engn Math, Giza 12613, Egypt

[3] German Univ Cairo, Fac IET, Dept Elect, Cairo, Egypt

[4] Cairo Univ, Fac Engn, Dept Elect Commun, Giza 12613, Egypt

来源：

2012 19TH IEEE INTERNATIONAL CONFERENCE ON ELECTRONICS, CIRCUITS AND SYSTEMS (ICECS) | 2012年

关键词：

Testing; Inverse problem; Sallen-Key; Noise analysis;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper introduces a testing algorithm based on the inverse problem concept. This algorithm detects single and double parametric faults in analog circuits by estimating the actual parameter values of the CUT. To verify the effectiveness of the proposed algorithm, it is applied to the Sallen-Key second order band pass filter where all injected faults are detected and diagnostic correctly with max percentage estimation error of 0.7%. Moreover, an additive white Gaussian noise is added to the output of the tested filter to verify the advanced performance of the proposed algorithm.

引用

页码：693 / 696

页数：4

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