EVALUATING THE POTENTIAL OF ORTHOGONAL DEFECT CLASSIFICATION FOR VERIFICATION AND VALIDATION OF MODELLING AND SIMULATION APPLICATIONS

被引:0
|
作者
Wang, Zhongshi [1 ]
机构
[1] ITIS, D-85577 Neubiberg, Germany
关键词
Verification and Validation (V&V); Orthogonal Defect Classification (ODC); Model Deficiency Classification; V&V Techniques;
D O I
暂无
中图分类号
TP39 [计算机的应用];
学科分类号
081203 ; 0835 ;
摘要
Model deficiencies, despite their negative influences on assessment of modelling and simulation (M&S) applications, carry a large amount of insightful information, which can be used to measure different aspects of the M&S development process and its verification and validation (V&V). Although there already exist various categorizations of model deficiencies, none of which can be used as a measurement tool to classify and analyze deficiency data collected in practice. Since several classifications and even an IEEE standard have been developed in the software community, this work investigates a well-known classification approach, the IBM Orthogonal Defect Classification (ODC) scheme in the M&S context. Based on the findings, a framework for developing model deficiency classifications is proposed, which can be applied to any simulation study with well structured model development and V&V processes.
引用
收藏
页码:113 / 120
页数:8
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