ADVANCEMENT IN CHARACTERIZATION AND MODELING OF BOUNDARY MIGRATION DURING RECRYSTALLIZATION

The boundary migration during recrystallization is characterized on the local scale using various experimental and modeling approaches. The modeling tools include atomic molecular dynamics simulations, numerical integration of the mesoscale equation of grain boundary motion and mesoscale phase-field simulations. The experiments cover in-situ 3D X-ray diffraction, 2D scanning electron microscopy (SEM), including in situ and ex situ annealing, as well as 3D SEM using focused ion beam sectioning, looking at Al, Ni and Cu deformed to medium, high and very high strains. It is discussed how the experiments and the modeling have been carried out hand in hand with the aim of advancing the understanding of boundary migration during recrystallization.