A 1.1V 35μm x 35μm thermal sensor with supply voltage sensitivity of 20°C/10%-supply for thermal management on the SX-9 supercomputer

被引：12

作者：

Saneyoshi, Eisuke ^{[1
]}

Nose, Koichi ^{[1
]}

Kajita, Mikihiro ^{[2
]}

Mizuno, Masayuki ^{[1
]}

机构：

[1] NEC Corp Ltd, Device Platforms Res Labs, Kanagawa 2291198, Japan

[2] NEC Corp Ltd, Div Comp, Tokyo, 1838501, Japan

来源：

2008 SYMPOSIUM ON VLSI CIRCUITS, DIGEST OF TECHNICAL PAPERS | 2008年

关键词：

D O I：

10.1109/VLSIC.2008.4585987

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Presented here is a thermal sensor, based on transistor off-leakage current, that allows measurement error of less than 3.1 degrees C at 90 degrees C and less than 2 degrees C at 10% Vdd deviation. For experimental evaluation, 11 thermal sensors, each of which occupied only 35 mu m x 35 mu m area, were placed on a chip, and both the location of a hotspot and the overall temperature distribution were successfully measured and agreed with simulation.

引用

页码：152 / +

页数：2

共 2 条

[1] A 1.1V 35μm x 35μm thermal sensor with supply voltage sensitivity of 2°C/10%-supply for thermal management on the SX-9 supercomputer
Saneyoshi, Eisuke
Nose, Koichi
Kajita, Mikihiro
Mizuno, Masayuki
[J]. 2008 IEEE SYMPOSIUM ON VLSI CIRCUITS, 2008, : 119 - +
[2] A 30.1μm2, < ±1.1°C-3σ-Error, 0.4-to-1.0V Temperature Sensor based on Direct Threshold Voltage Sensing for On Chip Dense Thermal Monitoring
Kim, Seongjong
Seok, Mingoo
[J]. 2015 IEEE CUSTOM INTEGRATED CIRCUITS CONFERENCE (CICC), 2015,

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