In-Situ Transmission Electron Microscope High Temperature Behavior in Nanocrystalline Platinum Thin Films

被引:5
|
作者
Garcia, Davil [1 ]
Leon, Alexander [2 ]
Kumar, Sandeep [1 ,2 ]
机构
[1] Univ Calif Riverside, Program Mat Sci & Engn, Riverside, CA 92521 USA
[2] Univ Calif Riverside, Dept Mech Engn, Riverside, CA 92521 USA
关键词
TEM OBSERVATIONS; DEFORMATION; NANOINDENTATION; PLASTICITY; MIGRATION; CAVITATION; MECHANISMS; SIZE;
D O I
10.1007/s11837-015-1477-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
In this work, we present a micro electro-mechanical systems (MEMS)-based in situ transmission electron microscope (TEM) experimental setup for high-temperature uniaxial tensile behavior of nanocrystalline thin films. This setup utilizes self-heating (Ohmic) to raise the temperature of thin films while applying uniaxial tensile loading using electro-thermal actuators. Self-heating is achieved by passing a high-density direct current through the specimen. We carried out a qualitative uniaxial tensile experiment on a 75-nm platinum thin film at 360 K. Temperature is estimated using COMSOL modeling. In this qualitative experiment, we observed initial grain growth followed by formation of edge serrations. We propose that grain boundary sliding coupled with grain
引用
收藏
页码:109 / 115
页数:7
相关论文
共 50 条
  • [1] In-Situ Transmission Electron Microscope High Temperature Behavior in Nanocrystalline Platinum Thin Films
    Davil Garcia
    Alexander Leon
    Sandeep Kumar
    JOM, 2016, 68 : 109 - 115
  • [2] In-Situ Observation of Fracture Behavior of Silicon in a Transmission Electron Microscope
    Okada, Kohei
    Tanaka, Syugo
    Nakata, Kensuke
    Nakajima, Masahiro
    Ando, Taeko
    2018 INTERNATIONAL SYMPOSIUM ON MICRO-NANOMECHATRONICS AND HUMAN SCIENCE (MHS), 2018,
  • [3] In-situ transmission electron microscope observation of nitriding processes of titanium thin films by nitrogen-implantation
    Wang, JJ
    Kasukabe, Y
    Yamamura, T
    Yamamoto, S
    Fujino, Y
    THIN SOLID FILMS, 2004, 464 : 175 - 179
  • [4] In Situ Indentation of Nanoporous Gold Thin Films in the Transmission Electron Microscope
    Sun, Ye
    Ye, Jia
    Minor, Andre W. M.
    Balk, T. John
    MICROSCOPY RESEARCH AND TECHNIQUE, 2009, 72 (03) : 232 - 241
  • [5] High temperature behavior of Cu films studied in-situ by Electron Backscatter Diffraction
    Mirpuri, K
    Wendrock, H
    Menzel, S
    Wetzig, K
    Szpunar, J
    MICROELECTRONIC ENGINEERING, 2004, 76 (1-4) : 160 - 166
  • [6] OBSERVATION IN-SITU WITH ELECTRON-MICROSCOPE ON OXIDATION OF THIN METAL-FILMS
    ESCAIG, J
    SELLA, C
    COMPTES RENDUS HEBDOMADAIRES DES SEANCES DE L ACADEMIE DES SCIENCES SERIE B, 1972, 274 (01): : 27 - &
  • [7] In-situ Transmission Electron Microscope Techniques for Heterogeneous Catalysis
    He, Bowen
    Zhang, Yixiao
    Liu, Xi
    Chen, Liwei
    CHEMCATCHEM, 2020, 12 (07) : 1853 - 1872
  • [8] In-situ operation of a scanning tunnelling microscope in a UHV transmission electron microscope
    Ohnishi, H
    Kondo, Y
    Takayanagi, K
    ELECTRON, 1998, : 501 - 506
  • [9] IN-SITU STRAINING EXPERIMENTS IN THE TRANSMISSION ELECTRON-MICROSCOPE
    MESSERSCHMIDT, U
    JOURNAL DE PHYSIQUE IV, 1993, 3 (C7): : 2123 - 2128
  • [10] In situ tensile testing of nanoscale freestanding thin films inside a transmission electron microscope
    M. A. Haque
    M. T. A. Saif
    Journal of Materials Research, 2005, 20 : 1769 - 1777