共 50 条
- [5] Scanning Electron Microscopy (SEM) and Atomic Force Microscopy (AFM): Complementary techniques for high resolution surface investigations Surface Modification Technologies XV, 2002, : 109 - 118
- [6] High resolution atomic force microscopy of cellulose microcrystals ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 1998, 216 : U344 - U344
- [10] HIGH-RESOLUTION ATOMIC FORCE MICROSCOPY POTENTIOMETRY JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1991, 9 (03): : 1559 - 1561