A method for compensating multiple-reflection effect in measurement of electro-optic coefficient

被引：3
|
作者：
Iwamura, Tomo [1 ]
Suka, Shota [1 ]
Liu, Xin Yi [1 ]
Umegaki, Shinsuke [1 ]
机构：
[1] Keio Univ, Fac Sci & Technol, Kohoku Ku, Yokohama, Kanagawa 2238522, Japan
来源：
OPTICAL REVIEW | 2009年 / 16卷 / 01期
关键词：
electro-optic effect; electro-optic coefficient; Mach-Zehnder interferometer; multiple-reflection; potassium titanyl phosphate; POLYMERS; INTERFEROMETRY; ACCURACY; FILMS;
D O I：
10.1007/s10043-009-0002-y
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
An electro-optic (EO) coefficient can be evaluated from a modulated signal by applying an AC voltage to a plane-parallel sample in an interferometer. We proposed a method for compensating multiple-reflection of a light in the sample. The multiple-reflection causes errors in the evaluated EO coefficient. In measurement using a Mach-Zehnder interferometer, we analyzed the multiple-reflection and clarified its unfavorable effect. The effect could be avoided simply by selecting the incidence angle of the light on the sample. We confirmed this by measuring the EO coefficient of a KTiOPO4 crystal.
引用
收藏
页码：4 / 10
页数：7
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