An Investigation of the Nano-Structure Titanum Dioxde Thin Films as a Function of Film Thickness

被引:0
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作者
Kangarloo, Haleh [1 ]
Shaygan, Fahime Farid [2 ]
Rafizadeh, Saeid [3 ]
机构
[1] Islamic Azad Univ, Fac Sci, Urmia Branch, Orumiyeh, Iran
[2] Islamic Azad Univ, Fac Sci, Shahriar Branch, Orumiyeh, Iran
[3] Islamic Azad Univ, Urmia Branch, Young Ress Club, Orumiyeh, Iran
来源
关键词
Titanium oxide; Spectrophotometry; Thin Films; Kramers-Kronig; Effective Medium Approximation; Optical behavior; DIRECT CONVOLUTION PRODUCTS; PATTERN FITTING ALGORITHMS; OPTICAL-PROPERTIES; TIO2; FILMS; PROFILE; OXIDE; DECONVOLUTION; GLASS;
D O I
10.4028/www.scientific.net/AMR.403-408.3
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
Using resistive heated method, Ti films of different thickness ranging from 10 to 200 nm were deposited and post-annealed at a temperature of 473K with a flow of oxygen. The optical properties were measured by transmission spectroscopy in spectral range of 200-2500 nm. The optical functions were obtained from the Kramers-Kronig analysis of the reflectivity curves. The effective medium approximation analysis was employed to establish the relationship between the nano-structure and Effective-Media Approximation (EMA) predictions.It was found the temperature of deposition and thefilm thickness play important roles in the nano-structure of the film and cause significant variations in the optical behaviour of thin Titanium oxide films.
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页码:3 / +
页数:3
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