SkSP-V SAMPLING PLAN WITH GROUP SAMPLING PLAN AS REFERENCE BASED ON TRUNCATED LIFE TEST UNDER WEIBULL AND GENERALIZED EXPONENTIAL DISTRIBUTIONS

被引：0

作者：

Aslam, Muhammad ^{[1
]}

Balamurali, S. ^{[2
]}

Jun, Chi-Hyuck ^{[3
]}

Ahmad, Munir ^{[4
]}

机构：

[1] Forman Christian Coll Univ, Dept Stat, Lahore, Pakistan

[2] Kalasalingam Univ, Dept Math, Krishnankoil 626190, TN, India

[3] POSTECH, Dept Ind & Management Engn, Pohang 790784, South Korea

[4] Natl Coll Business Adm & Econ, Lahore, Pakistan

来源：

PAKISTAN JOURNAL OF STATISTICS | 2013年 / 29卷 / 02期

关键词：

Skip-lot sampling; life tests; group sampling; producer and consumer risks; Weibull and generalized exponential distribution;

D O I：

暂无

中图分类号：

O21 [概率论与数理统计]; C8 [统计学];

学科分类号：

020208 ; 070103 ; 0714 ;

摘要：

This paper proposes SkSP-V acceptance sampling plans having group sampling plan based on the time truncated life test as the reference plan. The plan is designed for the mean life when the lifetime of the submitted product follows the Weibull distribution or the generalized exponential distribution. The two points on the operating characteristics curve is used to find the plan parameters satisfying the consumer's and the producer's risks while minimizing the average sample number. Also, the advantage of the proposed plan over the single group sampling plan is discussed. The extensive tables are provided and examples are given to adopt the plan in practice.

引用

页码：217 / 230

页数：14

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