An in situ time-resolved XRD-PSD investigation into Na-montmorillonite interlayer and particle rearrangement during dehydration

被引:35
|
作者
Wilson, J
Cuadros, J
Cressey, G
机构
[1] Univ Bristol, Dept Earth Sci, Bristol BS8 1RJ, Avon, England
[2] Nat Hist Museum, Dept Mineral, London SW7 5BD, England
关键词
dehydration; position-sensitive detector; smectite; X-ray diffraction;
D O I
10.1346/CCMN.2004.0520204
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
X-ray diffraction with a position-sensitive detector (XRD-PSD) Was used to make a time-resolved study of the dynamics of deposition and dehydration of Na-montmorillonite crystallites on flat substrates from deionized water Suspensions. The static PSD geometry and simultaneous Counting procedure allowed the acquisition of high-resolution data on the dynamics of interlayer and interparticle arrangements during dehydration. Three experimental datasets of Na-smectite dehydration are presented, each one representing different initial sample states (Suspension, slurry and re-wetted thin film). The computer program NEWMOD was used to Simulate one of the three datasets (dehydration of a smectite suspension) and thus obtain the apparent changes in relative proportions of different 001 values as smectite crystallites formed and dehydrated. Two types of diffracting domains formed: water-dispersed 'packets' of 1-2 smectite layers gaining long-range order in the c axis direction as water was lost to evaporation, and smectite layers deposited as hydrated crystallites with variable interlayer water contents. The experimental patterns show the rapid step-wise transition of Na-montmorillonite layers from d values of similar to55 to 18.5, 15.4 and 12.5 Angstrom, with variations that depended upon how the hydrated smectite sample was prepared. The simulations show that there was a wide range of d values whose frequency distribution changed as dehydration proceeded and that transient d Values Occurred between the peaks observed experimentally. The data obtained in this Study illustrate that XRD-PSD instruments have great potential in providing detailed data out the rapid kinetics of interlayer reorganization.
引用
收藏
页码:180 / 191
页数:12
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