Minority carrier lifetime and dark current measurements in mid-wavelength infrared InAs0.91Sb0.09 alloy nBn photodetectors

被引:17
|
作者
Olson, B. V. [1 ]
Kim, J. K. [1 ]
Kadlec, E. A. [1 ]
Klem, J. F. [1 ]
Hawkins, S. D. [1 ]
Leonhardt, D. [1 ]
Coon, W. T. [1 ]
Fortune, T. R. [1 ]
Cavaliere, M. A. [1 ]
Tauke-Pedretti, A. [1 ]
Shaner, E. A. [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
SEMICONDUCTORS;
D O I
10.1063/1.4935159
中图分类号
O59 [应用物理学];
学科分类号
摘要
Carrier lifetime and dark current measurements are reported for a mid-wavelength infrared InAs0.91Sb0.09 alloy nBn photodetector. Minority carrier lifetimes are measured using a non-contact time-resolved microwave technique on unprocessed portions of the nBn wafer and the Auger recombination Bloch function parameter is determined to be vertical bar F1F2 vertical bar = 0.292. The measured lifetimes are also used to calculate the expected diffusion dark current of the nBn devices and are compared with the experimental dark current measured in processed photodetector pixels from the same wafer. Excellent agreement is found between the two, highlighting the important relationship between lifetimes and diffusion currents in nBn photodetectors. (C) 2015 AIP Publishing LLC.
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页数:4
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