Comparison of different sources for laboratory X-ray microscopy

被引:6
|
作者
Ebensperger, T. [1 ,2 ]
Stahlhut, P. [1 ]
Nachtrab, F. [2 ,3 ]
Zabler, S. [1 ]
Hanke, R. [1 ,2 ,3 ]
机构
[1] Univ Wurzburg, Chair Xray Microscopy, D-97074 Wurzburg, Germany
[2] Fraunhofer Dev Ctr Xray Technol EZRT, D-90762 Furth, Germany
[3] Univ Erlangen Nurnberg, D-90762 Furth, Germany
来源
关键词
X-ray generators and sources; Inspection with x-rays; RESOLUTION;
D O I
10.1088/1748-0221/7/10/C10008
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper describes the setup of two different solutions for laboratory X-ray microscopy working with geometric magnification. One setup uses thin-film transmission targets with an optimized tungsten-layer thickness and the electron gun and optics of an electron probe micro analyzer to generate a very small X-ray source. The other setup is based on a scanning electron microscope and uses microstructured reflection targets. We also describe the structuring process for these targets. In both cases we show that resolutions of 100nm can be achieved. Also the possibilities of computed tomography for 3D imaging are explored and we show first imaging examples of high-absorption as well as low-absorption specimens to demonstrate the capabilities of the setups.
引用
收藏
页数:6
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