A new technique for the extraction of SPICE-type equivalent circuits from measured or computed S-parameters of microstrip components and discontinuities

被引：0
|
作者：
Werner, PL
Mittra, R
机构：
来源：
ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 1997年
关键词：
D O I：
10.1109/EPEP.1997.634041
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
This paper introduces a new technique based on the application of the Genetic Algorithm (GA) for extracting the equivalent circuits for measured or computed S-parameters that can be inserted into SPICE simulations, The GA is a robust optimization tool that is shown to yield excellent result for the sample test case of a right angle bend in a microstrip line.
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收藏
页码：70 / 73
页数：4
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