READER: Robust Semi-Supervised Multi-Label Dimension Reduction

被引:6
|
作者
Sun, Lu [1 ]
Kudo, Mineichi [1 ]
Kimura, Keigo [1 ]
机构
[1] Hokkaido Univ, Grad Sch Informat Sci & Technol, Sapporo, Hokkaido 0600808, Japan
关键词
multi-label classification; semi-supervised dimension reduction; risk minimization; feature selection; manifold learning; FORMULATION; LIBRARY;
D O I
10.1587/transinf.2017EDP7184
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
Multi-label classification is an appealing and challenging supervised learning problem, where multiple labels, rather than a single label, are associated with an unseen test instance. To remove possible noises in labels and features of high-dimensionality, multi-label dimension reduction has attracted more and more attentions in recent years. The existing methods usually suffer from several problems, such as ignoring label outliers and label correlations. In addition, most of them emphasize on conducting dimension reduction in an unsupervised or supervised way, therefore, unable to utilize the label information or a large amount of unlabeled data to improve the performance. In order to cope with these problems, we propose a novel method termed Robust sEmi-supervised multi-lAbel DimEnsion Reduction, shortly READER. From the viewpoint of empirical risk minimization, READER selects most discriminative features for all the labels in a semi-supervised way. Specifically, the l(2,1)-norm induced loss function and regularization term make READER robust to the outliers in the data points. READER finds a feature subspace so as to keep originally neighbor instances close and embeds labels into a low-dimensional latent space nonlinearly. To optimize the objective function, an efficient algorithm is developed with convergence property. Extensive empirical studies on real-world datasets demonstrate the superior performance of the proposed method.
引用
收藏
页码:2597 / 2604
页数:8
相关论文
共 50 条
  • [1] Semi-Supervised Dimension Reduction for Multi-label Classification
    Qian, Buyue
    Davidson, Ian
    [J]. PROCEEDINGS OF THE TWENTY-FOURTH AAAI CONFERENCE ON ARTIFICIAL INTELLIGENCE (AAAI-10), 2010, : 569 - 574
  • [2] Robust Multi-Label Semi-Supervised Classification
    Li, Sheng
    Fu, Yun
    [J]. 2017 IEEE INTERNATIONAL CONFERENCE ON BIG DATA (BIG DATA), 2017, : 27 - 36
  • [3] Semi-Supervised Multi-Label Dimensionality Reduction
    Guo, Baolin
    Hou, Chenping
    Nie, Feiping
    Yi, Dongyun
    [J]. 2016 IEEE 16TH INTERNATIONAL CONFERENCE ON DATA MINING (ICDM), 2016, : 919 - 924
  • [4] Noisy multi-label semi-supervised dimensionality reduction
    Mikalsen, Karl Oyvind
    Soguero-Ruiz, Cristina
    Bianchi, Filippo Maria
    Jenssen, Robert
    [J]. PATTERN RECOGNITION, 2019, 90 : 257 - 270
  • [5] Semi-Supervised Multi-Label Dimensionality Reduction Learning by Instance and Label Correlations
    Li, Runxin
    Du, Jiaxing
    Ding, Jiaman
    Jia, Lianyin
    Chen, Yinong
    Shang, Zhenhong
    [J]. MATHEMATICS, 2023, 11 (03)
  • [6] RSMS: Robust Semi-supervised Multi-label Feature Selection for Regression
    Kraus, Vivien
    Benabdeslem, Khalid
    Benkabou, Seif-Eddine
    Mansouri, Dou El Kefel
    Canitia, Bruno
    [J]. 2023 IEEE 35TH INTERNATIONAL CONFERENCE ON TOOLS WITH ARTIFICIAL INTELLIGENCE, ICTAI, 2023, : 99 - 105
  • [7] ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification
    Behpour, Sima
    Xing, Wei
    Ziebart, Brian D.
    [J]. THIRTY-SECOND AAAI CONFERENCE ON ARTIFICIAL INTELLIGENCE / THIRTIETH INNOVATIVE APPLICATIONS OF ARTIFICIAL INTELLIGENCE CONFERENCE / EIGHTH AAAI SYMPOSIUM ON EDUCATIONAL ADVANCES IN ARTIFICIAL INTELLIGENCE, 2018, : 2704 - 2711
  • [8] ARC: Adversarial Robust Cuts for Semi-Supervised and Multi-Label Classification
    Behpour, Sima
    Xing, Wei
    Ziebart, Brian D.
    [J]. PROCEEDINGS 2018 IEEE/CVF CONFERENCE ON COMPUTER VISION AND PATTERN RECOGNITION WORKSHOPS (CVPRW), 2018, : 1986 - 1988
  • [9] Semi-Supervised Partial Multi-Label Learning
    Xie, Ming-Kun
    Huang, Sheng-Jun
    [J]. 20TH IEEE INTERNATIONAL CONFERENCE ON DATA MINING (ICDM 2020), 2020, : 691 - 700
  • [10] Semi-Supervised Multi-Label Dimensionality Reduction Based on Dependence Maximization
    Yu, Yanming
    Wang, Jun
    Tan, Qiaoyu
    Jia, Lianyin
    Yu, Guoxian
    [J]. IEEE ACCESS, 2017, 5 : 21927 - 21940