Probabilistic diagnosis of clustered faults for shared structures

被引：10
|
作者：
Lu, Xiaojun [1 ]
Li, Jianping [1 ]
Seo, Chang-Jun [2 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Comp Sci, Chengdu 610054, Peoples R China
[2] Inje Univ, Dept EIRE, Gimhae, South Korea
来源：
MATHEMATICAL AND COMPUTER MODELLING | 2009年 / 49卷 / 3-4期
关键词：
Cluster fault; Probabilistic diagnosis; Shared structure; Performance analysis; CONNECTION ASSIGNMENT; SYSTEMS;
D O I：
10.1016/j.mcm.2008.06.011
中图分类号：
TP39 [计算机的应用];
学科分类号：
081203 ; 0835 ;
摘要：
The probabilistic diagnosis model is useful in many fields such as distributed network, digital system level testing and wafer fault testing. Some topologies and continuous defect units distributions are studied in our previous work. In this paper, we extend the model to arbitrary topology structure with share nodes and to the discrete defect distributions, such as Poission distribution and Binomial distribution. The results show high identification percentage of the nodes. (c) 2008 Elsevier Ltd. All rights reserved.
引用
收藏
页码：623 / 634
页数：12
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